Product Description

CdWO₄ crystal was produced by using the Bridgman technique since ***1, with the maximum crystal boule size at ∅ *0 mm x **0 mm, which can be manufactured into the target sizes, besides the single crystals, we also have the capability to fabricate it into linear or 2 dimensional array used in the X ray security inspection systems.

CdWO₄ crystal is characterized by high density, high atomic number and relatively high light yield with extremely low decay time. and  the afterglow of CdWO₄, when subjected to x-ray irradiation, is very slow typically less than 0.1% after 3 ms, and demonstrate very good resistance. All of these features are significant and make CdWO₄ a primary scintillation crystal for X ray computed Tomography(X-CT) and in security inspection.