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Shenzhen chuangxin Equipment Co., LTD.

#34,Xi Xiang Hua Qiao Village, Bao an, Shenzhen, China,Shenzhen,Guangdong,China

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IEC61032 Test Probe B, Test Finger Probe

China

CX-IP2X

400 ~ 600 / Get Latest Price

china

400

1 Set

Aluminum box

1

1000 Set per Month

T/T

Accessibility Probes

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Product Description

IEC*1032  Test Probe B
 

IP1X: 50mm Sphere test probe with hande

IP2X: Jointed finger Test pobe

IP3X: 2.5mm Test rod

IP4X: 1.0mm test wire

IEC*0529 IP2X Hinged Test Finger Probe
This Hinged Test Finger Probe is a precision test probe made according to IEC*0529 and is used to simulate a human finger to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.
The Articulated Finger Probe is also on the IEC*0335, IRAM**20-1, IEC*0598, IEC*0529 etc. It's presented in most of the rules involved in the verification of accessibility to parts.

Technical Parameters:

Kunrled finger diameter 12mm                                    
Knurled Finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm
 

Contact Us

Contact Person :Mr. hong

Company:Shenzhen chuangxin Equipment Co., LTD.

Address:#34,Xi Xiang Hua Qiao Village, Bao an, Shenzhen, China, Shenzhen, Guangdong, China,

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Mr. hong < Shenzhen chuangxin Equipment Co., LTD. >
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