
Introduction | |||||||||||||||||||||||||||||||||||||||||||||||||||||
ADX-2500 X-ray Diffraction Instrument is designed
for application in the microstructure measurement, testing and
in-depth research investigations. With different accessories and
the corresponding control and calculating software,ADX-2500 is a
diffraction system according to the practical requirements in many
fields. ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
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Features | |||||||||||||||||||||||||||||||||||||||||||||||||||||
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Software | |||||||||||||||||||||||||||||||||||||||||||||||||||||
General diffraction data processing: automatic peak
search, manual peak search, integral intensity, separation of Kα1,
α2, background remove, pattern smoothing and magnifying, multiple
plot, three-dimensional plot and simulation of XRD pattern.
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Parts and Specifications | |||||||||||||||||||||||||||||||||||||||||||||||||||||
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Contact Person :Mr. Angstrom
Company:Angstrom Advanced
Address:95 Mill Street, Stoughton, Massachusetts, USA,02072
Telephone:
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Fax:
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