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Contact Person Diana
No.46 Fumin Street, Lingang INdustrial Zone, Dandong City, China, Dandong, Liaoning
AL****0 series diffractometer is
designed for material research and industrial product analysis,and
it is a perfect product which combines the conventional analysis
and special purpose measurement.
*The
perfect combining with hardware and software system, satisfy with
the requirement of different application field academician,
scientific research.
*High
precision diffraction angle measuring system, obtaining more
accurate measurement results.
*High
stability X-ray generator control system, and get more stable
repeatable measurement precision.
*Various functional accessories meet the
requirement of different testing purposes.
*Program operation, integrated structure
design, easy to operate, more beautiful appearance of the
instrument;
*X-ray diffractometer is a kind of
universal testing instrument for revealing crystal structure and
chemical information of material:
*One
and many phase identification of unknown sample
*Quantitative analysis of the phase in
the mixed sample
*Crystal structure analysis ( Rietveld
structure analysis)
*The
crystal structure change (high temperature and low temperature
condition) of the abnormal condition.
*Thin
film sample analysis, including film, multilayer film thickness,
surface roughness, charge density.
*Analysis of micro area
sample.
*Texture and stress analysis of metallic
materials
| Al****0A | AL****0B | |
| Rated power | 3kW(HF, HV control technology) | 4kW |
| Tube voltage | *0~*0kV | |
| Tube current | 5~*0mA | 5~*0mA |
| X-ray tube | Metal ceramic tube Target material: Cu､Fe､Co､Cr､Mo, etc Power:2.4kW | |
| Focus size | 1×*0mm or 0.4×*4mm or 2×*2mm | |
| Stability | ≤0.**5% | ≤0.*1% |
| Goniometer structure | Sample level(θ~θ) | |
| Radius of diffraction | **5mm(or custom by request:**0~**5mmrange) | |
| 2θ Scanning range | ﹣6~**0°(θs:﹣3~*0°､θd:﹣3~*0°) | |
| Scanning speed | 0.***2°~*0°/min | |
| Angle locating speed | ***0°/min | |
| Scanning fashion | θs/ θd linkage /single acting; continuous, stepping and Omg | |
| Minimal stepping angle | 1/****0° | |
| Angle repeatable accuracy | 1/****0° | |
| 2θ Angular linearity | International standard sample(Si, Al**3), the angle of all peak in full spectrum are not more than ±0.*2° | |
| Detector | Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector | |
| Maximal counting rate of linearity | 5×*05CPS(PC､SC with the compensate function ofmisscounting)､*5×*04CPS (SDD)､9×*07CPS(one-dimensional array) | |
| Energy resolution ratio | ≤*5%(PC､one-dimensional array)､≤*0%(SC)､≤**0eV(SDD) | |
| Counting fashion | differential coefficient or integral,PHA automatically,dead time regulate | |
| Stability of system measure | ≤0.*1% | |
| Scattered rays dose | ≤1μSv/h(without X-ray protective device) | |
| Instrument integrative stability | ≤0.1% | ≤0.5% |
| Figure size | ***0×**0×***0mm | |
| Country: | China |
| Model No: | - |
| FOB Price: | Get Latest Price |
| Place of Origin: | - |
| Price for Minimum Order: | - |
| Minimum Order Quantity: | - |
| Packaging Detail: | - |
| Delivery Time: | - |
| Supplying Ability: | - |
| Payment Type: | - |
| Product Group : | - |
