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Shenzhen Chuangxin Instruments Co., LTD

Xixiang,Shenzhen,Guangdong,China China

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Products: 8

IEC Jointed Finger Probe

1: This probeis inteded to verify the basic protection against access to hazardous parts. It's also used toverify the protection against access wi

Test Sphere 50mm with hand

Application: Chuangxin offers a wide range of probes to meet the most common standards including those from IEC, EN, UL, GB and others. Such standars

Children Test finger probe 18 IEC61032

Children Test Finger Probe 18 IEC61032 1. Application: This probe is intended to simulate access to hazardous parts by children of more than 36 month

IEC61032 Test Probe C

This probe is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access wi

IEC61032 Test Probe D

This probe is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access wi

IEC60068-2-75 Spring-Operated Hammper Impact Test Apparatus 2J

It's used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessib

IEC61032/IEC60529 Figure 1 Test Probe A, 50mm Test Sphere

IEC61032 Sphere Test Equipment with handle Appliance: It's the necessary tool to proceed protecting electric shock test of household and similar e

IEC61032 Test Probe 11

IEC61032 Test Probe 11 Appliance: It's the necessary tool to proceed protecting electric shock test of household and similar electrical appliance

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    Ms. Ivy < Shenzhen Chuangxin Instruments Co., LTD >

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